
E75 LVDT Displacement Measurement System inductance micrometer is a contact micrometer, through the inductive probe to detect the external displacement deformation, the measurement range of 0~1mm, accuracy is better than 100nm.
Characteristics

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Touch screen
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Contact Digital Probe
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Measurement head |
Typical Application

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| Diameter and flatness measure | Coaxiality and dimensionality measure |
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| Scale factor | Eccentricity measure |
| Technical Data | |
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Type |
E75.LVDT-H |
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Measuring range(mm) |
0~1mm |
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Channels |
Single Channel |
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Resolution(μm |
0.05μm |
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Display update frequency |
10/s |
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Screen type |
Touch |
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Display type |
Digital rebound |
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Sensor reading rate |
200 readings per second |
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Analog output(mA) |
Voltage or 4~20 optional |
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Operating temperature(°C) |
5~50℃ |
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Storage temperature(°C) |
-20~50℃ |
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Accuracy (percentage of readings) |
0.05% or 0.1μm, whichever is larger |
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Repeatability (worst case) |
0.15μm, the difference between the maximum and minimum |
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Repeatability (typical) |
0.05μm, one standard deviation of multiple measurements |
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pretravel(mm) |
0.15 |
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After the trip(mm) |
0.35 |
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Spring driven (force measurement in middle position) |
0.70N±20% |
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Temperature drift coefficient of |
0.01%FS/ºC |
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Probe life (number of runs) |
100 million (without side load), more than 10 million in most applications |
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Probe shell material |
Steel |
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Probe materia |
Tungsten carbide |
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Computer interface mode |
RS-485 |
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Function |
Data acquisition, storage, triggering, etc |
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Mass(g±5%) |
1285 |
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