E75 LVDT Displacement Measurement System inductance micrometer is a contact micrometer, through the inductive probe to detect the external displacement deformation, the measurement range of 0~1mm, accuracy is better than 100nm.
Characteristics
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Touch screen ![]() |
Contact Digital Probe ![]() |
Measurement head |
Typical Application
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Diameter and flatness measure | Coaxiality and dimensionality measure |
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Scale factor | Eccentricity measure |
Technical Data | |
Type |
E75.LVDT-H |
Measuring range(mm) |
0~1mm |
Channels |
Single Channel |
Resolution(μm |
0.05μm |
Display update frequency |
10/s |
Screen type |
Touch |
Display type |
Digital rebound |
Sensor reading rate |
200 readings per second |
Analog output(mA) |
Voltage or 4~20 optional |
Operating temperature(°C) |
5~50℃ |
Storage temperature(°C) |
-20~50℃ |
Accuracy (percentage of readings) |
0.05% or 0.1μm, whichever is larger |
Repeatability (worst case) |
0.15μm, the difference between the maximum and minimum |
Repeatability (typical) |
0.05μm, one standard deviation of multiple measurements |
pretravel(mm) |
0.15 |
After the trip(mm) |
0.35 |
Spring driven (force measurement in middle position) |
0.70N±20% |
Temperature drift coefficient of |
0.01%FS/ºC |
Probe life (number of runs) |
100 million (without side load), more than 10 million in most applications |
Probe shell material |
Steel |
Probe materia |
Tungsten carbide |
Computer interface mode |
RS-485 |
Function |
Data acquisition, storage, triggering, etc |
Mass(g±5%) |
1285 |
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